Understanding the power MOSFET's UIS and avalanche energy - Power Circuit - Circuit Diagram

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In the datasheet of a power MOSFET, parameters such as single-pulse avalanche energy (EAS), avalanche current (IAR), and repetitive pulse avalanche energy (EAR) are typically listed. However, many electronic engineers often overlook these parameters when designing power systems, failing to fully consider their significance or how they impact real-world applications. These parameters play a crucial role in determining the robustness and reliability of a power system, especially under specific operational conditions. This article aims to address these concerns by exploring the working conditions of power MOSFETs under unclamped inductive switching scenarios.

Defining and Measuring EAS, IAR, and EAR

The avalanche energy of a MOSFET is closely tied to its thermal performance and operating state. Ultimately, the outcome is reflected in temperature rise, which depends on both the power level and the thermal properties of the silicon packaging. The thermal response of a power semiconductor to a fast power pulse (lasting between 100-200 μs) can be described by Equation 1:

Understanding the significance of these parameters is essential for ensuring that a power MOSFET operates effectively within its designed limits. For example, the single-pulse avalanche energy (EAS) indicates the maximum energy a device can handle without suffering permanent damage from a single transient event. Similarly, the avalanche current (IAR) defines the peak current that can flow through the device during an avalanche event before it fails. Lastly, the repetitive pulse avalanche energy (EAR) specifies the energy a device can endure when subjected to multiple transient events.

In practical applications, these parameters are critical for assessing the robustness of a power system under unclamped inductive switching conditions. Such conditions occur when the energy stored in an inductor is released without being clamped by a diode or other protective element. This can lead to very high transient voltages and currents, which can stress the MOSFET beyond its rated limits if not properly accounted for.

When designing a power system, engineers must carefully evaluate these parameters to ensure the chosen MOSFET can withstand the expected operating stresses. Factors such as the magnitude and duration of transient events, the thermal management of the system, and the overall efficiency of the design all play significant roles in determining whether a given MOSFET is suitable for a particular application.

In conclusion, understanding and correctly applying parameters like EAS, IAR, and EAR is vital for optimizing power system designs. By thoroughly analyzing these specifications and considering the unique challenges posed by unclamped inductive switching, engineers can create more reliable and efficient power solutions.

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